Advances in Applied Science Research Open Access

  • ISSN: 0976-8610
  • Journal h-index: 57
  • Journal CiteScore: 93.86
  • Average acceptance to publication time (5-7 days)
  • Average article processing time (30-45 days) Less than 5 volumes 30 days
    8 - 9 volumes 40 days
    10 and more volumes 45 days
Reach us +32 25889658


Linear and Nonlinear Local Resonances in Thin Rough Films

Ekpekpo, A., Iyayi, S. E., Aiyohihum, E.

In a thin dielectric, semiconductor or metal film in the regions or indentation there exist local "Plasmon" resonances of small radius 'tn << L, where L is the "horizontal" size of the roughness. Main characteristics of these resonances (frequencies and widths) are discussed as dependent on the roughness and on the degree of the film indentation when the dependence of the dielectric constant of the film on the electric field strength (e= eo(w) + aE2) in the region of the "Plasmon" resonance (i.e. at | eo(w)| << I) is taken into account, it leads to the appearance of new ("non-linear"} local resonances, The conditions of the appearance of such resonances, specially, the region of their localization, differ from analogous conditions for linear resonances.

0.329+ Million Readerbase
Share This Page
Recommended Webinars & Conferences