K. S. Chaudhari, Y. R. Toda, A. B. Jain and D. N. Gujarathi
Thin films having different thickness of InSe were deposited by thermal evaporation technique, onto precleaned amorphous glass substrate. The structural properties of films were evaluated by XRD, optical microscopy and TEM. The X-ray diffraction analysis confirms that films are polycrystalline having cubic structure cell. The average grain size is found to be 11.18-11.93 nm. The optical band gap of the films was measured by using optical absorption spectra. The estimated values of the direct and indirect optical band gaps of these samples were 0.81 to 0.84 eV and 1.31 to 2.18 eV respectively.
